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A non-ideal $\text{Si}$-based $\text{pn}$ junction diode is tested by sweeping the bias applied across its terminals from $-5\:V$ to $5\:V$. The effective thermal voltage, $V_{T}$, for the diode is measured to be $( 29\pm 2)mV$ . The resolution of the voltage source in the measurement range is $1$ $\text{mV}$ . The percentage uncertainty (rounded off to $2$ decimal places) in the measured current at a bias voltage of $\text{0.02 V}$ is  ____________.
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